Basic Electronics Class 6 – Troubleshooting: What to do when electronic circuits fail!
"Don’t Panic! …and always carry a towel.” – Ford Prefect, “Hitchhiker’s Guide to the Galaxy” (1995)
This Class 6 will integrate the electronics concepts studied in the previous five classes of this series, as well as provide a practical approach to the subject of electronics for first-time attendees. This class is both lecture and hands-on!
The Lecture portion of the class will focus on:
1. How does a power supply convert alternating current (AC) from a 110-volt wall outlet to direct current (DC)? What are the components of a typical AC/DC power supply?
2. What is an electronic signal and how does it compare to a waveform or pulse?
3. What does an analog signal look like compared to a digital signal? What does an audio signal look like? What do motor control signals look like? What do sensor signals look like?
4. How do you operate an oscilloscope and multimeter?
The Hands-on portion of the class will focus on:
During the practical part of the class, attendees will use an oscilloscope, multimeter and test equipment to take measurements, monitor digital and analog signals within electronic devices, and perform electronic troubleshooting techniques:
1. Describe the circuit problem in detail in order to define an area to begin troubleshooting– How did the circuit fail? What part of the circuit is not working?
2. If the circuit doesn’t turn on, check the switch, fuse and power supply components.
3. Block out the circuit with a schematic or “dead reckon” the circuit flow from power supply to cable harness and printed circuit board paths.
4. Look at individual components and use a multi-meter to make static measurements without power to the circuit. What components are most likely to fail first?
5. Take “snapshot” voltage readings with a multi-meter when power is applied to the circuit.
6. Trace moving electronic signals with an oscilloscope while power is applied to the circuit.
7. What would be needed to repair and fix the electronic device under test?