Please register to attend:
Every quarter, our analytics experts present a 30-minute update to our virtual user community. This quarter we will include a demo on how to identify and classify patterns of interest in big data, which is a critical part of any manufacturing scenario.
Join the live discussion with Chief Analytics Officer, Michael O’Connell, and the TIBCO Data Science Team.
You’ll learn about:
- Recent innovation projects and community activities
- TIBCO’s novel approach to pattern recognition as applied to semiconductor wafer maps
- How to use a combination of machine learning techniques and to identify patterns quickly and accurately from a large amount of data
- How to use these patterns to train and deploy a model to classify new wafers in real-time
Michael O’Connell, Chief Analytics Officer, TIBCO Software
Heleen Snelting, Director, Data Science, TIBCO Software
Nico Rode, Senior Data Scientist, TIBCO Software
Adam Faskowitz, Data Scientist, TIBCO Software